Test–retest reliability of Attention Network Test measures in schizophrenia
Eric Hahn; Thi Minh Tam Ta; Constanze Hahn; Linn K. Kuehl; Claudia Ruehl; Andres H. Neuhaus; Michael Dettling
- 作者Eric Hahn; Thi Minh Tam Ta; Constanze Hahn; Linn K. Kuehl; Claudia Ruehl; Andres H. Neuhaus; Michael Dettling
- 卷第133卷
- 文件大小173.70KB
- 发表时间2011
- DOI10.1016/j.schres.2011.09.026
- 页码218-222