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Test–retest reliability of Attention Network Test measures in schizophrenia

Test–retest reliability of Attention Network Test measures in schizophrenia

Eric Hahn; Thi Minh Tam Ta; Constanze Hahn; Linn K. Kuehl; Claudia Ruehl; Andres H. Neuhaus; Michael Dettling
  • 作者Eric Hahn; Thi Minh Tam Ta; Constanze Hahn; Linn K. Kuehl; Claudia Ruehl; Andres H. Neuhaus; Michael Dettling
  • 卷第133卷
  • 文件大小173.70KB
  • 发表时间2011
  • DOI10.1016/j.schres.2011.09.026
  • 页码218-222
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