[IEEE 2011 36th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2011) - Houston, TX, USA (2011.10.2-2011.10.7)] 2011 International Conference on Infrared, Millimeter, and Terahertz Waves - Micromachined probes for on-wafer characterization of terahertz and submillimeter-wave components
Weikle, R. M.; Barker, N. S.; Lichtenberger, A. W.; Reck, T.; Chen, L.; Zhang, C.; Arsenovic, A. I.; Bauwens, M. F.
- 作者Weikle, R. M.; Barker, N. S.; Lichtenberger, A. W.; Reck, T.; Chen, L.; Zhang, C.; Arsenovic, A. I.; Bauwens, M. F.
- 文件大小885.02KB
- 发表时间2011
- DOI10.1109/irmmw-THz.2011.6105162
- 页码1-2