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Scanning Probe Microscopy of Functional Materials || Dynamic Nanomechanical Characterization Using Multiple-Frequency Method

Scanning Probe Microscopy of Functional Materials || Dynamic Nanomechanical Characterization Using Multiple-Frequency Method

Kalinin, Sergei V.; Gruverman, Alexei

作者Kalinin, Sergei V.; Gruverman, Alexei
文件大小2925.29KB
发表时间2011
DOI10.1007/978-1-4419-7167-8_6
页码153-178

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