Modeling and Understanding of External Latchup in CMOS Technologies—Part I: Modeling Latchup Trigger Current
- 期刊名称IEEE Transactions on Device and Materials Reliability
- 作者Farbiz, Farzan; Rosenbaum, Elyse
- 卷第11卷
- 期第3期
- 印刷ISSN1530-4388
- 文件大小928.63KB
- 发表时间2011-09
- DOI10.1109/tdmr.2011.2159504
- 页码417-425
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