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Modeling and Understanding of External Latchup in CMOS Technologies—Part II: Minority Carrier Collection Efficiency

Modeling and Understanding of External Latchup in CMOS Technologies—Part II: Minority Carrier Collection Efficiency

Farbiz, Farzan; Rosenbaum, Elyse

期刊名称IEEE Transactions on Device and Materials Reliability
作者Farbiz, Farzan; Rosenbaum, Elyse
卷第11卷
期第3期
印刷ISSN1530-4388
文件大小807.84KB
发表时间2011-09
DOI10.1109/tdmr.2011.2159505
页码426-432

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