[IEEE 2011 International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2011.03.14-2011.03.16)] 2011 12th International Symposium on Quality Electronic Design - Modeling and analyzing NBTI in the presence of Process Variation
- 作者Siddiqua, Taniya; Gurumurthi, Sudhanva; Stan, Mircea R.
- 文件大小237.46KB
- 发表时间2011
- DOI10.1109/isqed.2011.5770699
- 页码1-8
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Inside back cover - Contents (continued from back cover)2010
Inside back cover - Contents (continued from back cover)2010
Inside back cover - Contents (continued from back cover)2010
Inside back cover - Contents (continued from back cover)2010
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