Placement for Immunity of Transient Faults in Cell-Based Design of Nanometer Circuits
- 期刊名称IEEE Transactions on Very Large Scale Integration (VLSI) Systems
- 作者Bhattacharya, Koustav; Ranganathan, Nagarajan
- 卷第19卷
- 期第5期
- 印刷ISSN1063-8210
- 电子ISSN1557-9999
- 文件大小373.20KB
- 发表时间2011-05
- DOI10.1109/tvlsi.2010.2040295
- 页码918-923
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