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Accurate calibration for the quantification of the Al content in AlGaN epitaxial layers by energy-dispersive X-ray spectroscopy in a Transmission Electron Microscope

Accurate calibration for the quantification of the Al content in AlGaN epitaxial layers by energy-dispersive X-ray spectroscopy in a Transmission Electron Microscope

Amari, H; Lari, L; Zhang, H Y; Geelhaar, L; Chèze, C; Kappers, M J; McAleese, C; Humphreys, C J; Walther, T
  • 期刊名称Journal of Physics: Conference Series
  • 作者Amari, H; Lari, L; Zhang, H Y; Geelhaar, L; Chèze, C; Kappers, M J; McAleese, C; Humphreys, C J; Walther, T
  • 卷第326卷
  • 电子ISSN1742-6596
  • 文件大小5344.14KB
  • 发表时间2011-11-09
  • DOI10.1088/1742-6596/326/1/012028
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