NVNA Techniques for Pulsed RF Measurements
Roblin, Patrick; Ko, Young; Yang, Chieh; Suh, Inwon; Doo, Seok
- 期刊名称IEEE Microwave Magazine
- 作者Roblin, Patrick; Ko, Young; Yang, Chieh; Suh, Inwon; Doo, Seok
- 卷第12卷
- 期第2期
- 印刷ISSN1527-3342
- 文件大小5256.83KB
- 发表时间2011-04
- DOI10.1109/mmm.2010.940103
- 页码65-76