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[IEEE 2011 IEEE 9th International New Circuits and Systems Conference (NEWCAS) - Bordeaux, France (2011.06.26-2011.06.29)] 2011 IEEE 9th International New Circuits and systems conference - Security challenges during VLSI test

[IEEE 2011 IEEE 9th International New Circuits and Systems Conference (NEWCAS) - Bordeaux, France (2011.06.26-2011.06.29)] 2011 IEEE 9th International New Circuits and systems conference - Security challenges during VLSI test

Hely, David; Rosenfeld, Kurt; Karri, Ramesh
  • 作者Hely, David; Rosenfeld, Kurt; Karri, Ramesh
  • 文件大小73.96KB
  • 发表时间2011
  • DOI10.1109/NEWCAS.2011.5981325
  • 页码486-489
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