Parametric Macromodeling for Sensitivity Responses From Tabulated Data
Chemmangat, Krishnan; Ferranti, Francesco; Knockaert, Luc; Dhaene, Tom
- 期刊名称IEEE Microwave and Wireless Components Letters
- 作者Chemmangat, Krishnan; Ferranti, Francesco; Knockaert, Luc; Dhaene, Tom
- 卷第21卷
- 期第8期
- 印刷ISSN1531-1309
- 电子ISSN1558-1764
- 文件大小408.25KB
- 发表时间2011-08
- DOI10.1109/lmwc.2011.2158536
- 页码397-399