[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Backend low-k TDDB chip reliability simulator
Bashir, Muhammad; Kim, Dae Hyun; Athikulwongse, Krit; Lim, Sung Kyu; Milor, Linda
- 作者Bashir, Muhammad; Kim, Dae Hyun; Athikulwongse, Krit; Lim, Sung Kyu; Milor, Linda
- 文件大小845.75KB
- 发表时间2011
- DOI10.1109/irps.2011.5784454