[IEEE 2011 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Hangzhou, China (2011.05.10-2011.05.12)] 2011 IEEE International Instrumentation and Measurement Technology Conference - Toward real-time kernel density estimate display for instrumentation
Barford, Lee; Gibbs, Ivan; Kelley, Richard
- 作者Barford, Lee; Gibbs, Ivan; Kelley, Richard
- 文件大小396.63KB
- 发表时间2011
- DOI10.1109/imtc.2011.5944150
- 页码1-6