[IEEE 2011 IEEE 4th International Nanoelectronics Conference (INEC) - Tao-Yuan, Taiwan (2011.06.21-2011.06.24)] The 4th IEEE International NanoElectronics Conference - Investigation of electrostatic integrity for ultra-thin-body GeOI and InGaAs-OI n-MOSFETs considering quantum confinement
- 作者Yu, Chang-Hung; Wu, Yu-Sheng; Hu, Vita Pi-Ho; Su, Pin
- 文件大小456.48KB
- 发表时间2011
- DOI10.1109/inec.2011.5991651
- 页码1-2
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