[IEEE 2011 IEEE Sensors - Limerick, Ireland (2011.10.28-2011.10.31)] 2011 IEEE SENSORS Proceedings - High-accuracy positioning using phase difference of electrode array for two-dimensional communication sensor network (2DCSN)
- 作者Oota, Toshifumi; Matsuda, Takashi; Kado, Youiti; Zhang, Bing
- 文件大小1309.74KB
- 发表时间2011
- DOI10.1109/icsens.2011.6127334
- 页码786-789
[IEEE 2008 IEEE International Conference on Microelectronic Test Structures - Edinburgh, UK (2008.03.24-2008.03.27)] 2008 IEEE International Conference on Microelectronic Test Structures - 2008 IEEE international conference on microelectronic test structures2008
[IEEE 2009 IEEE International Conference on Microelectronic Test Structures - Oxnard, CA, USA (2009.03.30-2009.04.2)] 2009 IEEE International Conference on Microelectronic Test Structures - 2009 IEEE International Conference on Microelectronic Test Structures2009
[IEEE 2005 IEEE International Conference on Microelectronic Systems Education (MSE'05) - Anaheim, CA, USA (2005.06.13-2005.06.13)] 2005 IEEE International Conference on Microelectronic Systems Education (MSE'05) - Proceedings. 2005 IEEE International Conference on Microelectronic Systems Education2005
[IEEE 1997 IEEE International Conference on Microelectronic Test Structures Proceedings - Monterey, CA, USA (1997.03.17-1997.03.20)] 1997 IEEE International Conference on Microelectronic Test Structures Proceedings ICMTS-97 - 1997 IEEE International Conference on Microelectronic Test Structures Proceedings1997
[IEEE 2005 IEEE International Conference on Microelectronic Systems Education (MSE'05) - Anaheim, CA, USA (2005.06.13-2005.06.13)] 2005 IEEE International Conference on Microelectronic Systems Education (MSE'05) - 2005 IEEE International Conference on Microelectronic Systems Education - Title Page2005
[IEEE 2005 IEEE International Conference on Microelectronic Systems Education (MSE'05) - Anaheim, CA, USA (2005.06.13-2005.06.13)] 2005 IEEE International Conference on Microelectronic Systems Education (MSE'05) - 2005 IEEE International Conference on Microelectronic Systems Education - Copyright Page2005
[IEEE 2007 IEEE Conference on Microelectronic Systems Education - San Diego, CA (2007.6.3-2007.6.4)] 2007 IEEE International Conference on Microelectronic Systems Education (MSE'07) - 2007 IEEE International Conference on Microelectronic Systems Education - Cover2007
[IEEE 2006 IEEE International Conference on Microelectronic Test Structures - Austin, TX, USA (2006.03.6-2006.03.9)] 2006 IEEE International Conference on Microelectronic Test Structures - ICMTS 2006 - Proceedings of the 2006 International Conference on Microelectronic Test Structures2006
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