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[IEEE 2011 IEEE Fourth International Conference on Software Testing, Verification and Validation (ICST) - Berlin, Germany (2011.03.21-2011.03.25)] 2011 Fourth IEEE International Conference on Software Testing, Verification and Validation - Mutation Testing of

[IEEE 2011 IEEE Fourth International Conference on Software Testing, Verification and Validation (ICST) - Berlin, Germany (2011.03.21-2011.03.25)] 2011 Fourth IEEE International Conference on Software Testing, Verification and Validation - Mutation Testing of "Go-Back" Functions Based on Pushdown Automata

Belli, Fevzi; Beyazit, Mutlu; Takagi, Tomohiko; Furukawa, Zengo

作者Belli, Fevzi; Beyazit, Mutlu; Takagi, Tomohiko; Furukawa, Zengo
文件大小388.26KB
发表时间2011
DOI10.1109/icst.2011.30
页码249-258

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