Hot carrier injection degradation under dynamic stress
Ma, Xiao-Hua; Cao, Yan-Rong; Hao, Yue; Zhang, Yue
- 期刊名称Chinese Physics B
- 作者Ma, Xiao-Hua; Cao, Yan-Rong; Hao, Yue; Zhang, Yue
- 卷第20卷
- 期第3期
- 印刷ISSN1674-1056
- 文件大小1008.74KB
- 发表时间2011-03
- DOI10.1088/1674-1056/20/3/037305