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[IEEE 2011 50th IEEE Conference on Decision and Control and European Control Conference (CDC-ECC 2011) - Orlando, FL, USA (2011.12.12-2011.12.15)] IEEE Conference on Decision and Control and European Control Conference - Probabilistic bounds for complete scanning in non-raster atomic force microscopy

[IEEE 2011 50th IEEE Conference on Decision and Control and European Control Conference (CDC-ECC 2011) - Orlando, FL, USA (2011.12.12-2011.12.15)] IEEE Conference on Decision and Control and European Control Conference - Probabilistic bounds for complete scanning in non-raster atomic force microscopy

Chang, Peter I.; Andersson, Sean B.

作者Chang, Peter I.; Andersson, Sean B.
文件大小1613.54KB
发表时间2011
DOI10.1109/cdc.2011.6160639
页码6278-6283

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