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Oxygen Ion Induced Charge in SiC MOS Capacitors Irradiated with Gamma-Rays

Ohshima, Takeshi; Iwamoto, Naoya; Onoda, Shinobu; Makino, Takahiro; Nozaki, Shinji; Kojima, Kazutoshi

期刊名称Materials Science Forum
作者Ohshima, Takeshi; Iwamoto, Naoya; Onoda, Shinobu; Makino, Takahiro; Nozaki, Shinji; Kojima, Kazutoshi
电子ISSN1662-9752
文件大小1004.92KB
发表时间2011-3
DOI10.4028/www.scientific.net/msf.679-680.362
页码362-365