AIP Conference Proceedings [AIP APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY: Twenty-First International Conference - Fort Worth, Texas, (USA) (8–13 August 2010)] - Positron Annihilation Induced Auger Electron Spectroscopic Studies Of Reconstructed Semiconductor Surfaces
Fazleev, N. G.; Reed, J. A.; Starnes, S. G.; Weiss, A. H.; McDaniel, Floyd D.; Doyle, Barney L.
- 作者Fazleev, N. G.; Reed, J. A.; Starnes, S. G.; Weiss, A. H.; McDaniel, Floyd D.; Doyle, Barney L.
- 印刷ISSN0094-243X
- 文件大小467.94KB
- 发表时间2011
- DOI10.1063/1.3586148
- 页码493-496