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Experimental Study on Electron Mobility in Accumulation-Mode Silicon-on-Insulator Metal–Oxide–Semiconductor Field-Effect Transistors

Kadotani, Naotoshi; Ohashi, Teruyuki; Takahashi, Tsunaki; Oda, Shunri; Uchida, Ken

期刊名称Japanese Journal of Applied Physics
作者Kadotani, Naotoshi; Ohashi, Teruyuki; Takahashi, Tsunaki; Oda, Shunri; Uchida, Ken
卷第50卷
期第9期
印刷ISSN0021-4922
电子ISSN1347-4065
文件大小587.37KB
发表时间2011-9-20
DOI10.1143/JJAP.50.094101