AC Stress-Induced Degradation of Amorphous InGaZnO Thin Film Transistor Inverter
- 作者D. Kim; D. Kong; S. Kim; Y. W. Jeon; Y. Kim; D. M. Kim; H. Kwon
- 文件大小114.03KB
- 发表时间2011
- DOI10.1143/JJAP.50.090202
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