The Impact of Y Addition into TiO 2 on Electronic States and Resistive Switching Characteristics
- 期刊名称Japanese Journal of Applied Physics
- 作者Ohta, Akio; Goto, Yuta; Kazalman, Mohd Fairuz; Wei, Guobin; Murakami, Hideki; Higashi, Seiichiro; Miyazaki, Seiichi
- 卷第50卷
- 期第6期
- 印刷ISSN0021-4922
- 电子ISSN1347-4065
- 文件大小393.21KB
- 发表时间2011-6-20
- DOI10.1143/JJAP.50.06GG01