Stability of Ni/SiO2 catalysts
Prof. Peter Birke; Dr. Reinhard Geyer; Klaus Hoheisel; Michael Keck; Dr. Axel Pachulski; Dr. Rainer Schödel
- 作者Prof. Peter Birke; Dr. Reinhard Geyer; Klaus Hoheisel; Michael Keck; Dr. Axel Pachulski; Dr. Rainer Schödel
- 卷第84卷
- 印刷ISSN0009-286X
- 电子ISSN1522-2640
- 文件大小121.92KB
- 发表时间2012
- DOI10.1002/cite.201100105
- 页码165-168