Local fields in conductor surface electromigration: A first-principles study in the low-bias ballistic limit
- 期刊名称Physical Review B
- 作者Bevan, Kirk H.; Zhu, Wenguang; Stocks, G. Malcolm; Guo, Hong; Zhang, Zhenyu
- 卷第85卷
- 期第23期
- 印刷ISSN1098-0121
- 电子ISSN1550-235X
- 文件大小613.42KB
- 发表时间2012-6
- DOI10.1103/physrevb.85.235421