Challenges for Semiconductor Test Engineering: A Review Paper
- 作者Stefan R. Vock, Omar J. Escalona, Colin Turner, Frank J. Owens
- 卷第28卷
- 期第3期
- 印刷ISSN0923-8174
- 电子ISSN1573-0727
- 文件大小269.82KB
- 发表时间2012-06
- DOI10.1007/s10836-011-5276-x
- 页码365-374
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