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Analytical modeling for 3D potential distribution of rectangular gate (RecG) gate-all-around (GAA) MOSFET in subthreshold and strong inversion regions

Analytical modeling for 3D potential distribution of rectangular gate (RecG) gate-all-around (GAA) MOSFET in subthreshold and strong inversion regions

Dheeraj Sharma; Santosh Kumar Vishvakarma
  • 作者Dheeraj Sharma; Santosh Kumar Vishvakarma
  • 卷第43卷
  • 期第6期
  • 印刷ISSN0026-2692
  • 文件大小594.94KB
  • 发表时间2012
  • DOI10.1016/j.mejo.2012.02.001
  • 页码358-363
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