Effect of the surface on ion-beam damage build-up in ZnO
M.T. Myers; S. Charnvanichborikarn; L. Shao; S.O. Kucheyev
- 作者M.T. Myers; S. Charnvanichborikarn; L. Shao; S.O. Kucheyev
- 卷第67卷
- 期第1期
- 印刷ISSN1359-6462
- 文件大小274.92KB
- 发表时间2012
- DOI10.1016/j.scriptamat.2012.03.021