[IEEE 2012 IEEE International Symposium on Electrical Insulation (ISEI) - San Juan, PR, USA (2012.06.10-2012.06.13)] 2012 IEEE International Symposium on Electrical Insulation - Comparative study of PD characteristics and degradation of PET insulation with a self-contained void, void with closed channel and void with vented channel
- 作者Adhikari, D.; Hepburn, D. M.; Stewart, B. G.
- 文件大小450.09KB
- 发表时间2012
- DOI10.1109/elinsl.2012.6251519
- 页码498-501