[IEEE 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Tallinn, Estonia (2012.04.18-2012.04.20)] 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Efficient link-level error resilience in 3D NoCs
- 作者Pasca, Vladimir; Rehman, Saif-Ur; Anghel, Lorena; Benabdenbi, Mounir
- 文件大小793.16KB
- 发表时间2012
- DOI10.1109/ddecs.2012.6219038
- 页码127-132
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Highly Sensitive Photocrosslinking System Using Fluorene Derivatives Having Vinyl Ether or Epoxy MoietyOkamura, Haruyuki; Mitsukura, Kazuyuki; Shirai, Masamitsu; Fujiki, Tsuyoshi; Yamada, Masahiro; Kawasaki, Shinichi · Journal of Photopolymer Science and Technology · 2005
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