Annealing effect on the electrical properties and microstructure of embedded Ni–Cr thin film resistor

• 作者Lifei Lai; Wenjin Zeng; Xianzhu Fu; Rong Sun; Ruxu Du
• 卷第538卷
• 印刷ISSN0925-8388
• 文件大小967.52KB
• 发表时间2012
• DOI10.1016/j.jallcom.2012.05.102