Concurrent Device/Specification Cause–Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures
- 作者Devarakond, S.K.; Sen, S.; Bhattacharya, S.; Chatterjee, A.
- 卷第29卷
- 期第1期
- 印刷ISSN0740-7475
- 文件大小1293.23KB
- 发表时间2012
- DOI10.1109/mdt.2011.2179348
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