Defect microstructure in heavy-ion-bombarded (0 0 0 1) ZnO
M.T. Myers; S. Charnvanichborikarn; C.C. Wei; Z.P. Luo; A. Aitkaliyeva; L. Shao; S.O. Kucheyev
- 作者M.T. Myers; S. Charnvanichborikarn; C.C. Wei; Z.P. Luo; A. Aitkaliyeva; L. Shao; S.O. Kucheyev
- 卷第60卷
- 期第17期
- 文件大小729.82KB
- 发表时间2012
- DOI10.1016/j.actamat.2012.07.046