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Evaluation of overshoot rate of lightning impulse withstand voltage test waveform based on new base curve fitting methods - application to practical diverse waveforms

Evaluation of overshoot rate of lightning impulse withstand voltage test waveform based on new base curve fitting methods - application to practical diverse waveforms

Ueta, G.; Tsuboi, T.; Okabe, S.
  • 作者Ueta, G.; Tsuboi, T.; Okabe, S.
  • 卷第19卷
  • 期第1期
  • 印刷ISSN1070-9878
  • 文件大小855.34KB
  • 发表时间2012
  • DOI10.1109/tdei.2012.6148538
  • 页码352-362
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