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Reliability optimization of analog integrated circuits considering the trade-off between lifetime and area

Reliability optimization of analog integrated circuits considering the trade-off between lifetime and area

Xin Pan; Helmut Graeb
  • 作者Xin Pan; Helmut Graeb
  • 卷第52卷
  • 期第8期
  • 文件大小453.73KB
  • 发表时间2012
  • DOI10.1016/j.microrel.2011.09.026
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