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[IEEE 2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Portland, OR, USA (2012.09.30-2012.10.3)] 2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) - Examination of Horizontal Current Bipolar Transistor (HCBT) with double and single polysilicon region

[IEEE 2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Portland, OR, USA (2012.09.30-2012.10.3)] 2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) - Examination of Horizontal Current Bipolar Transistor (HCBT) with double and single polysilicon region

Suligoj, T.; Koricic, M.; Mochizuki, H.; Morita, S.; Shinomura, K.; Imai, H.

作者Suligoj, T.; Koricic, M.; Mochizuki, H.; Morita, S.; Shinomura, K.; Imai, H.
文件大小1170.55KB
发表时间2012
DOI10.1109/BCTM.2012.6352626
页码1-4

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