Nonlinear Multi-Error Correction Codes for Reliable MLC nand Flash Memories
Wang, Zhen; Karpovsky, Mark; Joshi, Ajay
- 期刊名称IEEE Transactions on Very Large Scale Integration (VLSI) Systems
- 作者Wang, Zhen; Karpovsky, Mark; Joshi, Ajay
- 卷第20卷
- 期第7期
- 印刷ISSN1063-8210
- 电子ISSN1557-9999
- 文件大小929.02KB
- 发表时间2012-07
- DOI10.1109/TVLSI.2011.2157183
- 页码1221-1234