发现好书期刊,享受阅读乐趣

海量图书期刊资源,随时随地畅享阅读乐趣

Nonlinear Multi-Error Correction Codes for Reliable MLC nand Flash Memories

Nonlinear Multi-Error Correction Codes for Reliable MLC nand Flash Memories

Wang, Zhen; Karpovsky, Mark; Joshi, Ajay
  • 期刊名称IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • 作者Wang, Zhen; Karpovsky, Mark; Joshi, Ajay
  • 卷第20卷
  • 期第7期
  • 印刷ISSN1063-8210
  • 电子ISSN1557-9999
  • 文件大小929.02KB
  • 发表时间2012-07
  • DOI10.1109/TVLSI.2011.2157183
  • 页码1221-1234
← 返回【学霸图书馆】主页