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[IEEE 2012 Annual IEEE India Conference (INDICON) - Kochi, India (2012.12.7-2012.12.9)] 2012 Annual IEEE India Conference (INDICON) - Oxide thickness effect on quantum capacitance in single-gate MOSFET and CNTFET devices

[IEEE 2012 Annual IEEE India Conference (INDICON) - Kochi, India (2012.12.7-2012.12.9)] 2012 Annual IEEE India Conference (INDICON) - Oxide thickness effect on quantum capacitance in single-gate MOSFET and CNTFET devices

Sinha, Sanjeet Kumar; Chaudhury, Saurabh
  • 作者Sinha, Sanjeet Kumar; Chaudhury, Saurabh
  • 文件大小746.65KB
  • 发表时间2012
  • DOI10.1109/INDCON.2012.6420586
  • 页码42-46
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