$SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing - Diffracted beam parameters of TE <sub/>0</sub> mode symmetrical MQW planar waveguide$

SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing - Diffracted beam parameters of TE ₀ mode symmetrical MQW planar waveguide

Guo, Fuyuan; Li, Lianhuang; Zheng, Hua; Lin, Xiangdi; Namba, Yoshiharu; Xing, Tingwen

作者Guo, Fuyuan; Li, Lianhuang; Zheng, Hua; Lin, Xiangdi; Namba, Yoshiharu; Xing, Tingwen
卷第8420卷
印刷ISSN0277-786X
文件大小186.21KB
发表时间2012
DOI10.1117/12.975931

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