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[IEEE 2012 IEEE/CPMT 28th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2012.03.18-2012.03.22)] 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - Test ASIC for investigation of thermal coupling in Many-Core Architectures

[IEEE 2012 IEEE/CPMT 28th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2012.03.18-2012.03.22)] 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - Test ASIC for investigation of thermal coupling in Many-Core Architectures

Szermer, Michal; Maj, Cezary; Pietrzak, Piotr; Janicki, Marcin; Zajac, Piotr; Napieralski, Andrzej
  • 作者Szermer, Michal; Maj, Cezary; Pietrzak, Piotr; Janicki, Marcin; Zajac, Piotr; Napieralski, Andrzej
  • 文件大小358.53KB
  • 发表时间2012
  • DOI10.1109/STHERM.2012.6188839
  • 页码135-138
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