[IEEE 2012 International Symposium on Electronic System Design (ISED) - Kolkata, India (2012.12.19-2012.12.22)] 2012 International Symposium on Electronic System Design (ISED) - SoC Time to Market Improvement through Device Driver Reuse: An Industrial Experience
Srivastava, Rohit; Mudgil, Nandini; Gupta, Gaurav; Mondal, Hemanta
- 作者Srivastava, Rohit; Mudgil, Nandini; Gupta, Gaurav; Mondal, Hemanta
- 文件大小600.90KB
- 发表时间2012
- DOI10.1109/ISED.2012.61
- 页码56-61