[IEEE 2012 IEEE Custom Integrated Circuits Conference - CICC 2012 - San Jose, CA, USA (2012.09.9-2012.09.12)] Proceedings of the IEEE 2012 Custom Integrated Circuits Conference - 6T SRAM and 3T DRAM data retention and remanence characterization in 65nm bulk CMOS
- 作者Cakir, Cagla; Bhargava, Mudit; Mai, Ken
- 文件大小2114.10KB
- 发表时间2012
- DOI10.1109/CICC.2012.6330672
- 页码1-4
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