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[IEEE 2012 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) - San Francisco, CA, USA (2012.06.3-2012.06.4)] 2012 IEEE International Symposium on Hardware-Oriented Security and Trust - Reliability enhancement of bi-stable PUFs in 65nm bulk CMOS

[IEEE 2012 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) - San Francisco, CA, USA (2012.06.3-2012.06.4)] 2012 IEEE International Symposium on Hardware-Oriented Security and Trust - Reliability enhancement of bi-stable PUFs in 65nm bulk CMOS

Bhargava, Mudit; Cakir, Cagla; Mai, Ken

作者Bhargava, Mudit; Cakir, Cagla; Mai, Ken
文件大小868.84KB
发表时间2012
DOI10.1109/HST.2012.6224314
页码25-30

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