[IEEE 2012 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu (2012.04.23-2012.04.25)] Proceedings of Technical Program of 2012 VLSI Technology, System and Application - New observations on the AC random telegraph noise (AC RTN) in nano-MOSFETs
Runsheng Wang, ; Jibin Zou, ; Xiaoqing Xu, ; Changze Liu, ; Jinhua Liu, ; Hanming Wu, ; Yangyuan Wang, ; Ru Huang,
- 作者Runsheng Wang, ; Jibin Zou, ; Xiaoqing Xu, ; Changze Liu, ; Jinhua Liu, ; Hanming Wu, ; Yangyuan Wang, ; Ru Huang,
- 文件大小1812.15KB
- 发表时间2012
- DOI10.1109/VLSI-TSA.2012.6210146
- 页码1-2