[IEEE 2012 4th IEEE International Memory Workshop (IMW) - Milan (2012.05.20-2012.05.23)] 2012 4th IEEE International Memory Workshop - Retention Model for High-Density ReRAM

Wei, Z.; Takagi, T.; Kanzawa, Y.; Katoh, Y.; Ninomiya, T.; Kawai, K.; Muraoka, S.; Mitani, S.; Katayama, K.; Fujii, S.; Miyanaga, R.; Kawashima, Y.; Mikawa, T.; Shimakawa, K.; Aono, K.

作者Wei, Z.; Takagi, T.; Kanzawa, Y.; Katoh, Y.; Ninomiya, T.; Kawai, K.; Muraoka, S.; Mitani, S.; Katayama, K.; Fujii, S.; Miyanaga, R.; Kawashima, Y.; Mikawa, T.; Shimakawa, K.; Aono, K.
文件大小420.57KB
发表时间2012
DOI10.1109/imw.2012.6213638
页码1-4

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[IEEE 2012 4th IEEE International Memory Workshop (IMW) - Milan (2012.05.20-2012.05.23)] 2012 4th IEEE International Memory Workshop - Retention Model for High-Density ReRAM