发现好书期刊,享受阅读乐趣

海量图书期刊资源,随时随地畅享阅读乐趣

[IEEE 2012 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Suita, Japan (2012.05.9-2012.05.11)] 2012 IEEE International Meeting for Future of Electron Devices, Kansai - Electrical property of DNA field-effect transistor; Charge retention property

[IEEE 2012 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Suita, Japan (2012.05.9-2012.05.11)] 2012 IEEE International Meeting for Future of Electron Devices, Kansai - Electrical property of DNA field-effect transistor; Charge retention property

Maeno, Shoko; Takagi, Shyogo; Matsuo, Naoto; Yamana, Kazushige; Heya, Akira; Takada, Tadao; Yokoyama, Shin
  • 作者Maeno, Shoko; Takagi, Shyogo; Matsuo, Naoto; Yamana, Kazushige; Heya, Akira; Takada, Tadao; Yokoyama, Shin
  • 文件大小247.67KB
  • 发表时间2012
  • DOI10.1109/imfedk.2012.6218621
  • 页码1-2
← 返回【学霸图书馆】主页