[IEEE 2012 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2012.06.10-2012.06.11)] 2012 IEEE Silicon Nanoelectronics Workshop (SNW) - On the statistical trap-response (STR) method for characterizing random trap occupancy and NBTI fluctuation
- 作者Zou, Jibin; Liu, Changze; Wang, Runsheng; Xu, Xiaoqing; Liu, Jinhua; Wu, Hanming; Wang, Yangyuan; Huang, Ru
- 文件大小472.40KB
- 发表时间2012
- DOI10.1109/snw.2012.6243346
- 页码1-2
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