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[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - Hybrid selector for high-X scan compression

[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - Hybrid selector for high-X scan compression

Wohl, P.; Waicukauski, J. A.; Neuveux, F.; Colburn, J. E.

作者Wohl, P.; Waicukauski, J. A.; Neuveux, F.; Colburn, J. E.
文件大小490.68KB
发表时间2012
DOI10.1109/test.2012.6401558
页码1-10

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