[IEEE 2012 IEEE 10th International New Circuits and Systems Conference (NEWCAS) - Montreal, QC, Canada (2012.06.17-2012.06.20)] 10th IEEE International NEWCAS Conference - Instrumentation circuitry for an inductive wear debris sensor
- 作者Davis, Joseph P.; Carletta, Joan E.; Veillette, Robert J.; Du, Li; Zhe, Jiang
- 文件大小2015.75KB
- 发表时间2012
- DOI10.1109/newcas.2012.6329066
- 页码501-504
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