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[IEEE 2012 XXVth International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV 2012) - Tomsk, Russia (2012.09.2-2012.09.7)] 2012 25th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV) - Microscopic observation and analysis of field electron emission sites by using an Electron Emission Microscope and Auger Electron Spectrometer

[IEEE 2012 XXVth International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV 2012) - Tomsk, Russia (2012.09.2-2012.09.7)] 2012 25th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV) - Microscopic observation and analysis of field electron emission sites by using an Electron Emission Microscope and Auger Electron Spectrometer

Kanai, Tomohiro; Yamano, Yasushi; Kobayashi, Shinichi; Saito, Yoshio
  • 作者Kanai, Tomohiro; Yamano, Yasushi; Kobayashi, Shinichi; Saito, Yoshio
  • 文件大小478.12KB
  • 发表时间2012
  • DOI10.1109/deiv.2012.6412456
  • 页码83-86
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